fig4

Figure 4. Release of residual strain in perovskite films. GIXRD patterns of (A) control, (B) AA-, (C) ABA-, and (D) DBA-modified perovskite films; (E) SCLC measurements of electron-only devices; (F) PL spectra of control, AA-, ABA-, and DBA-modified perovskite films. GIXRD: Grazing-incidence X-ray diffraction; AA: L-aspartic acid; ABA: 4-aminobutyric acid; DBA: L-2,4-diaminobutyric acid; SCLC: space-charge-limited current; PL: photoluminescence.