fig7

Microstructural origin of dual band emission and thermal dynamics in suspended silicon-on-insulator infrared sources

Figure 7. Thermal flux and IR radiation spectra of the infrared light source. Schematic of the thermal flux of the (A) suspended- and (B) closed-membrane infrared-light-source chips; (C) Infrared emissivity under an applied voltage of 5 V; (D) Infrared radiation intensity under continuous voltage variation from 5 to 6.4 V.

Microstructures
ISSN 2770-2995 (Online)

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/