fig6
From: Residual stress mapping of additively manufactured Inconel 718 via synchrotron X-ray diffraction
Figure 6. Maps showing the difference in measured residual strain between fits using a Pseudo-Voigt and a Gaussian profile for X-ray diffraction data from the additively manufactured IN718 sample. Results are shown for the (A) LD, (B) TD, and (C) ND, respectively. The color scale indicates the strain difference (με), with positive values indicating that the Pseudo-Voigt fit resulted in a larger strain magnitude and negative values indicating a smaller strain magnitude than the Gaussian fit. Each map corresponds to a different crystallographic plane (hkl), as indicated above each panel. LD: Loading direction; TD: transverse direction; ND: normal direction; IN718: Inconel 718.
