fig7
From: Residual stress mapping of additively manufactured Inconel 718 via synchrotron X-ray diffraction
Figure 7. Maps showing the difference in measured residual stress between Pseudo-Voigt and Gaussian profiles when fitting X-ray diffraction data from additively manufactured IN718. Results are shown for the (A) LD and (B) TD, respectively. The color scale indicates the stress difference (MPa), with positive values indicating that the Pseudo-Voigt fit resulted in a larger residual stress magnitude and negative values indicating a smaller residual stress magnitude than the Gaussian fit. Each map corresponds to a different crystallographic plane (hkl), as indicated above each panel. LD: Loading direction; TD: transverse direction; IN718: Inconel 718.
