fig3

Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems

Figure 3. Channel attention weight distribution of the AE-PINN. The top panel shows the attention weight for each of the 512 channels, and the bottom panel shows the cumulative distribution. Approximately 200 channels contribute 90% of the total attention mass. AE-PINN: Attention-enhanced physics-informed neural network; SiC: silicon carbide.

Intelligence & Robotics
ISSN 2770-3541 (Online)

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/