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fig6

From:  Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems
Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems

Figure 6. Visualization of AE-PINN training results. AE-PINN: Attention-enhanced physics-informed neural network.

Intelligence & Robotics
ISSN 2770-3541 (Online)
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